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Tutorial-1/Speaker-2
Statistical analysis of HBM channel performance

High-bandwidth memory (HBM) is a high-performance memory interface to achieve high bandwidth, low power dissipation, and advanced packaging, which uses more than a thousand channels. Thus, large power noise could occur due to the switching of thousands of I/O drivers, and HBM channel performance could be seriously affected. The time-varying nature of the power noise makes the HBM channel non-linear and the conventional statistical methods cannot accurately account for this non-linearity. In this talk, a statistical eye-diagram estimation method is presented to design and evaluate the HBM channels including both signal and power nets, where the power distribution network is modeled using lumped elements and I/O driver is assumed as an inverter using the 180nm MOS technology. The proposed statistical method is based on a multiple edge response (MER) approach, and the Data Bus Inversion (DBI) coding is implemented in the proposed method.

Jun Fan, Missouri University of Science and Technology

Jun Fan received the B.S. and M.S. degrees from Tsinghua University, Beijing, China, in 1994 and 1997, respectively and the Ph.D. degree from the University of MissouriRolla, USA, in 2000, all in electrical engineering. From 2000 to 2007, he was a Consultant Engineer with NCR Corporation, San Diego, CA, USA. In July 2007, he was with the Missouri University of Science and Technology, where he is currently an Associate Professor in the Missouri Science and Technology Electromagnetic Compatibility Laboratory. His research interests include signal integrity and electromagnetic interference designs in high-speed digital systems, dc power-bus modeling, intrasystem EMI and RF interference, PCB noise reduction, differential signaling, and cable/connector designs. Dr. Fan was the Chair of the IEEE EMC Society TC-9 Computational Electromagnetics Committee from 2006 to 2008 and was a Distinguished Lecturer of the IEEE EMC Society in 2007 and 2008. He is currently the Vice Chair of the Technical Advisory Committee of the IEEE EMC Society and is an Associate Editor of the IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY and the EMC Magazine. He was the recipient of the IEEE EMC Society Technical Achievement Award in August 2009.